Scientific Committee

• Johann Kastner (FH OÖ Campus Wels/AT)
• Valentina Aloisi (Carl Zeiss Industrielle Messtechnik, Germany)
• Markus Bartscher (PTB, Brunswick/DE)
• Joost Batenburg (CWI, Amsterdam/NL)
• Simone Carmignato (Univ. of Padua/IT)
• Marius Costin (CEA LIST, Institut Carnot, Saclay/FR)
• Jan De Beenhouwer (University of Antwerp Antwerpen/BE)
• Francesco De Carlo (APS, Aragonne/US)
• Wim Dewulf (KU Leuven, Leuven/BE)
• Gustavo Donatelli (CERTI, Florianópolis/BR)
• Anton du Plessis (Math2Market North America Inc, Atlanta/US; Stellenbosch University, Stellenbosch/SA)
• Eduard Gröller (TU Vienna/AT)
• Christoph Heinzl (University of Passau/DE)
• Jakobus Hoffman (Necsa, Pretoria/SA)
• James Hunter (Los Alamos National Laboratory/US)
• Valerie Kaftandjian (CEA LIST, Institut Carnot, Saclay/FR)
• Stefan Kasperl (FhG-EZRT, Fürth/DE)
• Chang-Ock Lee (KAIST, Daejeon/KR)
• Felix Meli (METAS, Berne-Wabern/CH)
• Frank Muecklich (Univ. Saarbrücken/DE)
• Lars Pejryd (University of Örebro, ÖREBRO/SE)
• Guillermo C. Requena (DLR, Köln/DE)
• Markus Sause (University Augsburg, Augsburg/DE)
• Sascha Senck (FH OÖ Campus Wels/AT)
• Jan Sijbers (University of Antwerp, Antwerpen/BE)
• Ian Sinclair (Univ. Southampton/UK)
• Rainer Stössel (Airbus Corporate Technology Office, Central R&T, Materials, Munich/DE)
• Hiromasa Suzuki (University of Tokyo/JP)
• Norman Uhlmann (FhG-IIS, Fürth/DE)
• Daniel Vavrik (CTU, Prague/CZ)
• Martine Wevers (KU Leuven/BE)
• Jose A. Yagüe-Fabra (Univ. Zaragoza/ES)
• Simon Zabler (TH Deggendorf, Deggendorf/DE)
• Robert Zboray (EMPA, Dübendorf/CH)